





Scanning Electron Microscopy and X-Ray MicroanalysisThird Edition
Author(s): Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
Format: Paperback
Publisher: Springer-Verlag New York Inc., United States
Imprint: Springer-Verlag New York Inc.
ISBN-13: 9781461349693, 978-1461349693
Synopsis
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) a.
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Details:Scanning Electron Microscopy and X-Ray MicroanalysisThird Edition
Author(s): Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
Format: Paperback
Publisher: Springer-Verlag New York Inc., United States
Imprint: Springer-Verlag New York Inc.
ISBN-13: 9781461349693, 978-1461349693
Synopsis
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) a.
Price now:
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Scanning Electron Microscopy and X-Ray MicroanalysisThird Edition
Author(s): Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
Format: Paperback
Publisher: Springer-Verlag New York Inc., United States
Imprint: Springer-Verlag New York Inc.
ISBN-13: 9781461349693, 978-1461349693
Synopsis
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) a.
General | |
|---|---|
format | trade paperback |
Language | english |
type | textbook |
Color | multicolor |
Gender | unisex |
Brand | Joseph Goldstein |
artist | not specified |
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